๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

An investigation of surface nanocrystallization mechanism in Fe induced by surface mechanical attrition treatment

โœ Scribed by N.R. Tao; Z.B. Wang; W.P. Tong; M.L. Sui; J. Lu; K. Lu

Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
663 KB
Volume
50
Category
Article
ISSN
1359-6454

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Local thermal property analysis by scann
Local thermal property analysis by scanning thermal microscopy of an ultrafine-grained copper surface layer produced by surface mechanical attrition treatment
โœ F.A. Guo; Y.L. JI; N. Trannoy; J. Lu ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 454 KB

Scanning thermal microscopy (SThM) was used to map thermal conductivity images in an ultrafine-grained copper surface layer produced by surface mechanical attrition treatment (SMAT). It is found that the deformed surface layer shows different thermal conductivities that strongly depend on the grain

Mechanisms of surface roughness induced
Mechanisms of surface roughness induced in silicon by fluorine containing plasmas
โœ Ronaldo D Mansano; Patrick Verdonck; Homero S Maciel ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 321 KB

## Deep trenches were etched in silicon with SF, plasmas in a simple RIE system. Two process factors influence directly the silicon surface roughness generated by these processes: the dc bias voltage and the presence of oxygen. In general, the roughness increases when the dc bias voltage becomes mor