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An Investigation of Negative Differential Resistance and Novel Collector–Current Kink Effects in SiGe HBTs Operating at Cryogenic Temperatures

✍ Scribed by Jiahui Yuan; John D. Cressler; Chendong Zhu; Yan Cui; Guofu Niu; Qingqing Liang; Alvin J. Joseph


Book ID
114618623
Publisher
IEEE
Year
2007
Tongue
English
Weight
427 KB
Volume
54
Category
Article
ISSN
0018-9383

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