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An investigation of amorphous Ge[sub 2]Se[sub 3] structure for phase change memory devices using fluctuation electron microscopy

✍ Scribed by Jarvis, K.; Carpenter, R. W.; Davis, M.; Campbell, K. A.


Book ID
120013458
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
681 KB
Volume
106
Category
Article
ISSN
0021-8979

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