✦ LIBER ✦
An investigation into the dependence of the chemically-etched edge profiles of silicon dioxide films on etchant concentration and temperature
✍ Scribed by R.A. Haken; I.M. Baker; J.D.E. Beynon
- Book ID
- 107862008
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 980 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.