An inverse estimation scheme to measure steady-state tool–chip interface temperatures using an infrared camera

✍ Scribed by P Kwon; T Schiemann; R Kountanya

• Book ID: 104348361
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 437 KB
• Volume: 41
• Category: Article
• ISSN: 0890-6955
• DOI: 10.1016/s0890-6955(00)00113-9