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An interface crack in a functionally graded piezoelectric bi-layer under anti-plane shear impact

โœ Scribed by Jeong Woo Shin, Young-Shin Lee, Sung Joon Kim


Book ID
120919890
Publisher
Springer Vienna
Year
2012
Tongue
English
Weight
676 KB
Volume
224
Category
Article
ISSN
0001-5970

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