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An integrated system for quantitative EDXRF analysis based on fundamental parameters

✍ Scribed by Fei He; Pierre Van Espen

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 312 KB
Volume: 299
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(90)90848-z

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