✦ LIBER ✦
An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch
✍ Scribed by Subhayu Basu; Indranil Sengupta; Dipanwita Roy Chowdhury; Sudipta Bhawmik
- Book ID
- 110349680
- Publisher
- Springer US
- Year
- 2002
- Tongue
- English
- Weight
- 167 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0923-8174
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