An Integrated AFM and SANS Approach toward Understanding Void Formation in Conductive Composite Materials

✍ Scribed by Oakey, J.; Marr, D. W. M.; Schwartz, K. B.; Wartenberg, M.

• Book ID: 126067798
• Publisher: American Chemical Society
• Year: 2000
• Tongue: English
• Weight: 427 KB
• Volume: 33
• Category: Article
• ISSN: 0024-9297
• DOI: 10.1021/ma0000024