An Integral approach to measurement of surface roughness parameters from light scattering in dielectric waveguides

✍ Scribed by A. N. Osovitskii

• Book ID: 111452156
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2011
• Tongue: English
• Weight: 169 KB
• Volume: 56
• Category: Article
• ISSN: 1064-2269
• DOI: 10.1134/s1064226911010086