An inspection policy for one-unit system subject to revealed and unrevealed failures: Kouichi Adachi and Toshio Nishida. Microelectron. Reliab. 21 (1) 51 (1981)

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 114 KB
• Volume: 22
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(82)90123-8