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An indentation method to measure the CRSS of semiconducting materials at elevated temperature

✍ Scribed by J.P. Rivière; L. Largeau; G. Patriarche; E. Le Bourhis

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
141 KB
Volume
400-401
Category
Article
ISSN
0921-5093

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In this paper, an inverse method is developed to measure the axial modulus of materials subjected to tensile loads. The approach is intended for use on long composite structures the modulus of which is frequency dependent. The governing differential equations of a laboratory test configuration are s