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An in situ sem kossel x-ray diffraction study of pseudoelasticity

✍ Scribed by Cunningham, B.; Ashbee, K.H.G.


Book ID
123418626
Publisher
Elsevier Science
Year
1990
Weight
538 KB
Volume
38
Category
Article
ISSN
0956-7151

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In Situ X-ray diffraction studies of ele
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A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating, in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this techniq