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An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

✍ Scribed by Yong-Gil Lee; Jeong-Dong Lee; Yong-Il Song; Se-Jun Lee


Publisher
Springer Netherlands
Year
2007
Tongue
English
Weight
154 KB
Volume
70
Category
Article
ISSN
0138-9130

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