An Improvement to the Numerical Robustness of the Surface Potential Approximation for Double-Gate MOSFETs

✍ Scribed by Hariharan, V.; Vasi, J.; Rao, V.R.

• Book ID: 114619321
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 498 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.2011721