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An improved two-frequency method of capacitance measurement for SrTiO3 as high-k gate dielectric

✍ Scribed by Hang-Ting Lue, ; Chih-Yi Liu, ; Tseung-Yuen Tseng,


Book ID
120276084
Publisher
IEEE
Year
2002
Tongue
English
Weight
248 KB
Volume
23
Category
Article
ISSN
0741-3106

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