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An improved jet thinning apparatus for the preparation of Si-Ge alloy foils

โœ Scribed by Rowe, D M


Book ID
120533493
Publisher
Institute of Physics
Year
1978
Weight
246 KB
Volume
11
Category
Article
ISSN
0022-3735

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๐Ÿ“œ SIMILAR VOLUMES


An apparatus for measuring internal fric
โœ V.E. Miloshenki; I.V. Zolotukhin; V.S. Postnikov ๐Ÿ“‚ Article ๐Ÿ“… 1973 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 251 KB

We have designed and built an apparatus for measuring internal friction Q-1 (t) and electrical resistance of thin films and foils, of thickness 1 to 200 ~2, in the temperature range from 4.2 to 300 K.