An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors

✍ Scribed by Vernon, R.J.; Dorschner, T.A.

• Book ID: 117926823
• Publisher: IEEE
• Year: 1971
• Tongue: English
• Weight: 854 KB
• Volume: 19
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.1971.1127502