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An improved absorption correction based on a Gaussian ionization distribution model for electron probe microanalysis

✍ Scribed by Tanuma, Shigeo; Nagashima, Kozo

Book ID: 122877312
Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 397 KB
Volume: 36
Category: Article
ISSN: 0584-8547
DOI: 10.1016/0584-8547(81)80127-9

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