An explanation for the low-temperature H evolution peak in hydrogenated amorphous silicon films deposited 'on the edge of crystallinity'

✍ Scribed by Mahan, A.H.; Beyer, W.; Williamson, D.L.; Yang, J.; Guha, S.

• Book ID: 126940679
• Publisher: Taylor and Francis Group
• Year: 2000
• Tongue: English
• Weight: 158 KB
• Volume: 80
• Category: Article
• ISSN: 0950-0839
• DOI: 10.1080/09500830050134372