✦ LIBER ✦
An experimentally validated analytical model for gate line-edge roughness (LER) effects on technology scaling
✍ Scribed by Diaz, C.H.; Hun-Jan Tao, ; Yao-Ching Ku, ; Yen, A.; Young, K.
- Book ID
- 120824728
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 65 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0741-3106
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