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An experimental investigation of the end-hat effects in a crossed-field amplifier via three-dimensional electron density measurements

✍ Scribed by Ye, J.Z.; Chung Chan; MacGregor, R.; Ruden, T.E.


Book ID
114535639
Publisher
IEEE
Year
1994
Tongue
English
Weight
721 KB
Volume
41
Category
Article
ISSN
0018-9383

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