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An expansion function suited for fast full-wave spectral domain analysis of microstrip discontinuities

✍ Scribed by Cicchetti, Renato ;Faraone, Antonio


Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
749 KB
Volume
4
Category
Article
ISSN
1050-1827

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✦ Synopsis


Abstract

A representation of the surface current density particularly suited for the electrodynamic characterization of arbitrarily shaped discontinuities in monolithic microwave and millimeter‐wave integrated circuits (MMICs) is presented. The spectral domain approach (SDA) is adopted to carry out the analysis. Some numerical results, obtained using the proposed current representation, are compared with those available in the literature. A fast and excellent numerical convergence for the scattering parameters is achieved.