An estimation of EDXRF spectrometer properties, based on a two-layer composite Si-Ge detector

✍ Scribed by A. Yu. Portnoy; G. V. Pavlinsky; M. S. Gorbunov; Yu. I. Sidorova

• Book ID: 112233346
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 231 KB
• Volume: 41
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/xrs.2396