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An Estimate of the Uncertainty of Measurements of Lattice Spacings in Silicon Single Crystals Using a Laboratory x-Ray Diffractometer

✍ Scribed by Gavrilenko, V. P.; Ermakova, M. A.; Zablotskii, A. V.; Kuzin, A. Yu.; Todua, P. A.; Filippov, M. N.

Book ID: 125365908
Publisher: Springer US
Year: 2014
Tongue: English
Weight: 131 KB
Volume: 56
Category: Article
ISSN: 0543-1972
DOI: 10.1007/s11018-014-0378-3

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