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An EPR study of fast neutron radiation damage in silicon

✍ Scribed by Daly, D. F.; Noffke, H. E.


Book ID
126592755
Publisher
Informa UK (Taylor & Francis)
Year
1971
Weight
642 KB
Volume
8
Category
Article
ISSN
0033-7579

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Radiation damage study of GaAs detectors
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We investigated the radiation hardness of GaAs pad detectors irradiated by fast neutrons. The main goal was to determine the degradation of the charge collection efficiency (CCE) of the irradiated detectors and to measure the charge transport properties in terms of the mt-product. Several GaAs pad d