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An electron microscope study of near-surface damage caused by Xe and Ne ion implantation in CuInSe2 single crystals

✍ Scribed by A. Zegadi; A. Belattar; C.A. Faunce; E. Ahmed; S. Anwar; M.V. Yakushev; M. Imanieh; M.A. Slifkin; A.E. Hill; R.D. Tomlinson


Book ID
113285468
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
648 KB
Volume
94
Category
Article
ISSN
0168-583X

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