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An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices

✍ Scribed by Koch, Christoph T.; Ozdol, V. Burak; van Aken, Peter A.


Book ID
111693915
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
671 KB
Volume
96
Category
Article
ISSN
0003-6951

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