✦ LIBER ✦
An efficient method for characterizing time-evolutional interface state and its correlation with the device degradation in LDD n-MOSFETs
✍ Scribed by Giahn-Horng Lee, R.; Jiunn-Pey Wu; Chung, S.S.
- Book ID
- 114536473
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 664 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0018-9383
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