An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture

✍ Scribed by Min-yong Wan; Yong Ding; Yun Pan; Xiao-lang Yan

• Publisher: Springer US
• Year: 2011
• Tongue: English
• Weight: 258 KB
• Volume: 27
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-011-5258-z