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An effect of the subthreshold current on scaled-down MOS dynamic RAMs

✍ Scribed by Mashiko, K.; Yamada, M.; Nagayama, Y.; Yoshihara, T.; Nakano, T.


Book ID
119798256
Publisher
IEEE
Year
1983
Tongue
English
Weight
405 KB
Volume
18
Category
Article
ISSN
0018-9200

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