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An automatic setup for measuring low-field temperature dependencies of magnetoresistances of film samples

โœ Scribed by P. D. Kim; D. L. Khalyapin; L. E. Bykova


Book ID
110167468
Publisher
Springer
Year
2007
Tongue
English
Weight
151 KB
Volume
50
Category
Article
ISSN
0020-4412

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