✦ LIBER ✦
An automated electrical defect identification and location method for CMOS processes using a specially designed test chip : Alain R. Comeau. IEEE Transactions on Semiconductor Manufacturing5(3), 207 (1992)
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 221 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0026-2714
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