An audit of technological innovation capabilities in chinese firms: some empirical findings in Beijing, China

✍ Scribed by Richard C.M. Yam; Jian Cheng Guan; Kit Fai Pun; Esther P.Y. Tang

• Book ID: 116861674
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 149 KB
• Volume: 33
• Category: Article
• ISSN: 0048-7333
• DOI: 10.1016/j.respol.2004.05.004