✦ LIBER ✦
An attempt to explain thermally induced soft failures during low level ESD stresses: study of the differences between soft and hard NMOS failures
✍ Scribed by P. Salome; C. Leroux; D. Mariolle; D. Lafond; J.P. Chante; P. Crevel; G. Reimbold
- Book ID
- 108362392
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 533 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0026-2714
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