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An atom-resolved view of silicon nanoclusters

✍ Scribed by D.W. McComb; B.A. Collings; R.A. Wolkow; D.J. Moffatt; C.D. MacPherson; D.M. Rayner; P.A. Hackett; J.E. Hulse

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
406 KB
Volume
251
Category
Article
ISSN
0009-2614

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✦ Synopsis

Atomically resolved scanning tunneling microscope images of Si clusters deposited onto a Sic11 l)-7 X 7 substrate have been obtained. The clusters display a capping layer of widely spaced surface atoms analogous to the reconstructed surface of a bulk crystal. Site-specific variations in the electronic characteristics of cluster surface atoms are detected. Adsorption studies demonstrate size dependant reactivity of deposited clusters. Clusters are observed to collapse upon annealing to form epitaxial Si islands.

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