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An approach to determining parasitic elements for laser diodes

โœ Scribed by Gao Jianjun; Gao Baoxin; Pan Bo; Liang Chunguang

Book ID
102516187
Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
113 KB
Volume
34
Category
Article
ISSN
0895-2477

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โœฆ Synopsis

Abstract

A simple way to extract the parasitic elements of the laser diode model is proposed. The parasitic elements are determined by directly using measured S~11~ parameters versus frequency at zero bias point and above threshold current bias point. Thus the need for optimization during the extraction is reduced, and excellent agreement has been achieved between the experimental and calculated results. ยฉ 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 191โ€“193, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10414

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