An approach estimating the number of domain walls and eddy current losses in grain-oriented 3% Si-Fe tape wound cores

✍ Scribed by Yo Sakaki

• Book ID: 114644857
• Publisher: IEEE
• Year: 1980
• Tongue: English
• Weight: 425 KB
• Volume: 16
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.1980.1060653