An application of thermal microscopes to the measurement of thermal effusivity of films

✍ Scribed by Kimihito Hatori; Kei Suzuki; Hiroyuki Fukuyama; Hiromichi Ohta

• Publisher: John Wiley and Sons
• Year: 2009
• Tongue: English
• Weight: 805 KB
• Volume: 38
• Category: Article
• ISSN: 1099-2871
• DOI: 10.1002/htj.20227

✦ Synopsis

Abstract

The application of thermal microscopes to the measurement of local thermal properties has drawn considerable scientific interest. We report on the application of a thermal microscope to the measurement of thermal effusivity for films comprising alumina deposited on a substrate, which were fabricated by an electrophoretic deposition method. The measured data was analyzed to consider the undulations on the sample surface The thermal effusivity of these samples was approximately 1×10^3^ Js^−0.5^m^−2^K^−1^; this value is smaller than that for dense alumina because the alumina grain makes contact with a point. © 2008 Wiley Periodicals, Inc. Heat Trans Asian Res; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/htj.20227