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An Apparatus for Measuring the High-Temperature Thermal Conductivity of Semiconductors and Their Melts

โœ Scribed by Ya. B. Magomedov; G. G. Gadzhiev

Book ID
111586958
Publisher
Springer
Year
2004
Tongue
English
Weight
84 KB
Volume
47
Category
Article
ISSN
0020-4412

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An apparatus developed for the measurement of thermal conductivity of solids at temperatures from 350 to 1250 K in air, vacuum, or any other controlled atmosphere is described. It is based on the steady-state axial heat flow comparative method and can be used for measurements of conductivities in th