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An angle-resolved photoelectron spectroscopy study of the electronic structures of Si(001)2×2-Al and -In surfaces

✍ Scribed by H.W. Yeom; T. Abukawa; Y. Takakuwa; M. Nakamura; M. Kimura; T. Shimatani; Y. Mori; A. Kakizaki; S. Kono


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
307 KB
Volume
80
Category
Article
ISSN
0368-2048

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