An analytical two-dimensional simulation for the GaAs MESFET drain-induced barrier lowering: a short-channel effect

✍ Scribed by Chang, C.-S.; Day, D.-Y.S.; Chan, S.

• Book ID: 114534386
• Publisher: IEEE
• Year: 1990
• Tongue: English
• Weight: 442 KB
• Volume: 37
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.108177