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An analytical model for the narrow-width effect in ion-implanted MOSFETs : P. T. Lai and Y. C. Cheng. Solid St. Electron.27 (7), 639 (1984)


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
123 KB
Volume
25
Category
Article
ISSN
0026-2714

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