✦ LIBER ✦
An analytical model for self-limiting behavior of hot-carrier degradation in 0.25 mu m n-MOSFET's
✍ Scribed by C. Liang; H. Gaw; P. Cheng
- Book ID
- 126600290
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 260 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0741-3106
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