An analysis of voltage bias stressing characteristics of tantalum thin film capacitor : M. Nakamura, J. Yamazaki, W. Endou, Y. Nishimura. Trans. Inst. Electron. Commun. Engrs. Japan 55C, No. 4 (1972), p. 207. (In Japanese.)

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 111 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90688-4