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An analysis of the errors due to the discreteness of electron fluxes in analytical instruments

✍ Scribed by S. S. Gots; R. Z. Bakhtizin

Publisher: Springer US
Year: 2008
Tongue: English
Weight: 294 KB
Volume: 51
Category: Article
ISSN: 0543-1972
DOI: 10.1007/s11018-009-9171-0

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## Abstract An efficient technique is developed in this article to extrapolate the near‐field data falling outside the measurement region in the bipolar scanning. It is based on the nonredundant sampling representations of the electromagnetic field and on the optimal sampling interpolation expansio