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An analysis of systematic phase errors due to nonlinearity in fringe scanning systems

✍ Scribed by Nagaaki Ohyama; Takeshi Shimano; Jumpei Tsujiuchi; Toshio Honda

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 175 KB
Volume: 58
Category: Article
ISSN: 0030-4018
DOI: 10.1016/0030-4018(86)90437-2

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