✦ LIBER ✦
An analysis of silicon oxide thin films by computer simulation of Si 2p XPS spectra using the Sanderson technique
✍ Scribed by M.S. Sahota; E.L. Short; J. Beynon
- Book ID
- 115990714
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 423 KB
- Volume
- 195
- Category
- Article
- ISSN
- 0022-3093
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