An analysis of deep depletion thin-film MOS transistors : S. R. Hofstein, IEEE Trans.ED-13, No. 12, December (1966), p. 846

• Book ID: 103267466
• Publisher: Elsevier Science
• Year: 1967
• Tongue: English
• Weight: 103 KB
• Volume: 6
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(67)90327-7