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An alternative micro-area X-ray diffraction method for residual stress measurement of Pb(Zr,Ti)O3 film

✍ Scribed by F. Yang; W.D. Fei; Z.M. Gao; J.Q. Jiang


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
482 KB
Volume
202
Category
Article
ISSN
0257-8972

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